Author:
Tsai Tzong-Ru,Lio Yuhlong,Jiang Nan,Ng Hon Keung Tony,(Din) Chen Ding-Geng
Reference37 articles.
1. Andersen PK, Borgan O, Gill RD, Keiding N (1992) Statistical models based on counting processes. Springer, New York
2. Barbosa EP, Colosimo EA, Louzada-Neto F (1996) Accelerated life tests analyzed by a piecewise exponential distribution via generalized linear models. IEEE Trans Reliab 45:619–623
3. Cox DR, Miller HD (1965) The theory of stochastic processes. John Wiley & Sons, New York
4. Duan F, Cooper S, Marathe A, Zhang J, Jayanarayanan SK (2006) Impact of monitoring voltage on the lifetime extrapolation during the accelerated degradation tests. Integrated Reliability Workshop, pp 139–141
5. Escobar LA, Meeker WQ (2006) A review of accelerated test models. Stat Sci 21:552–577
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