1. Bushnell, M., Agrawal, V.: Essentials of electronic testing for digital, memory and mixed- signal VLSI circuits, vol. 17. Springer Science & Business Media, Boston (2004)
2. Chakraborty, R.S., Pagliarini, S., Mathew, J., Sree Ranjani, R., Nirmala Devi, M.: A flexible online checking technique to enhance hardware trojan horse detectability by reliability analysis. IEEE Trans. Emerg. Topics Comput. 5(2), 260–270 (2017)
3. Dupuis, S., Ba, P.S., Di Natale, G., Flottes, M.L., Rouzeyre, B.: A novel hardware logic encryption technique for thwarting illegal overproduction and hardware trojans. In: 2014 IEEE 20th International On-Line Testing Symposium (IOLTS), pp. 49–54. IEEE (2014)
4. Guide, D.V.U., Version, D.: March 2010. synopsys R (2010)
5. Jose, S.: Innovation is at risk as semiconductor equipment and materials. Semiconductor Equipment and Material Industry(SEMI) (2008)