Yield Management of Recent IC Chips
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Publisher
Springer Nature Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-99-6649-3_52
Reference9 articles.
1. Barnett TS, Bickford JP, Weger AJ. Product yield prediction system and critical area database. IEEE Trans Semicond Manuf. 2008;21(3):337–41. https://doi.org/10.1109/TSM.2008.2001207.
2. Imai K, Kaga T. A novel filtering method to extract three critical yield loss components (gross, repeated, and random) FIMER. IEEE Trans Semicond Manuf. 2000;13(4):408–15. https://doi.org/10.1109/66.892626.
3. Gong F, Yu H, Shi Y, Kim D, Ren J, He L. QuickYield: an efficient global-search based parametric yield estimation with performance constraints, Design Automation Conference, Anaheim, CA, USA, 2010, pp. 392–397. https://doi.org/10.1145/1837274.1837372.
4. Iizuka T, Ikeda M, Asada K. Timing-aware cell layout de-compaction for yield optimization by critical area minimization. IEEE Trans Very Large Scale Integr (VLSI) Syst. 2007;15(6):716–20. https://doi.org/10.1109/TVLSI.2007.898754.
5. Barnett TS, Bickford J, Weger AJ. Product yield prediction system and critical area database, 2007 IEEE/SEMI advanced semiconductor manufacturing conference, Stresa, Italy, 2007, pp. 351–355. https://doi.org/10.1109/ASMC.2007.375062.
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