Design of Reliability Single Sampling Plan by Attributes Based on Exponentiated Exponential Distribution

Author:

Loganathan A.,Gunasekaran M.

Publisher

Springer Singapore

Reference14 articles.

1. Aslam, M., Shahbaz, M.Q.: Economic reliability test plans using the generalized exponential distribution. J. Stat. 14, 53–60 (2007)

2. Aslam, M., Kantam, K.K.L.: Economic reliability acceptance sampling based on truncated life tests in the Birnbaum-Saunders distribution. Pak. J. Statist. 24(4), 269–276 (2008)

3. Aslam, M., Kundu, D., Ahmad, M.: Time truncated acceptance sampling plans for generalized exponential distribution. J. Appl. Stat. 37(4), 555–566 (2010)

4. Balasooriya, U., Saw, S.L.C.: Reliability sampling plans for the two-parameter exponential distribution under progressive censoring. J. Appl. Stat. 25(5), 707–714 (1998)

5. Epstein, B.: Truncated life tests in the exponential case. Ann. Math. Stat. 25(3), 555–564 (1954)

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