Use of Support Vector Machine to Check Whether Process Metrics are as Good as Static Code Metrics
Author:
Publisher
Springer Nature Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-19-0745-6_4
Reference8 articles.
1. Dejaeger K, Verbraken T, Baesens B (2013) Toward comprehensible software fault prediction models using Bayesian network classifiers. IEEE Trans Software Eng 39(2):237–257
2. Dreiseitl S, Ohno-Machado L. Logistic regression and artificial neural network classification models: a methodology review. J Biomed Inform 35:352–359
3. Rish I (2001) An empirical study of the naive Bayes classifier. IJCAI Works Empirical Methods Artif Intell 3:41–46
4. Catal C, Sevim U, Diri B. Practical development of an eclipse-based software fault prediction tool using Naive Bayes algorithm. Expert Syst Appl 38(3):2347–2353
5. Malhotra R, Sharma A (2018) Analyzing machine learning techniques for fault prediction using web applications. J Inf Process Syst 14:751–770. https://doi.org/10.3745/JIPS.04.0077
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