Fault Localization Method by Utilizing Memory Map and Input-Driven Update Interval
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Publisher
Springer Singapore
Link
http://link.springer.com/content/pdf/10.1007/978-981-10-1536-6_24
Reference8 articles.
1. Altinger H, Wotawa F, Schurius M (2014) Testing methods used in the automotive industry: results from a survey. In: JAMAICA proceedings of the 2014 workshop on joining AcadeMiA and industry contributions to test automation and model-based testing
2. Siegl S, Hielscher K-S, German R (2010) Model based requirements analysis and testing of automotive systems with timed usage models. In: The 18th IEEE international on requirements engineering conference, pp 345–350
3. Wong WE et al (1995) Effect of test set minimization on fault detection effectiveness. In: The 17th international conference on software engineering, pp 41–50
4. Choi K-Y et al (2015) HiL testing based fault localization method using memory update frequency. In: The 10th KIPS international conference on ubiquitous information technologies and applications, vol 373, no 1, pp 765–772
5. Xie X et al (2010) Spectrum-based fault localization without test oracles. Technical Report UTDCS-07-10
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