Noise Voltage: A New Dependability Concern in Low-Power FinFET-Based Priority Encoder at 45 nm Technology
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Publisher
Springer Singapore
Link
http://link.springer.com/content/pdf/10.1007/978-981-15-5224-3_40
Reference10 articles.
1. Bernstein, K.: Design and CAD challenges in sub-90 nm CMOS technologies. In: Proceeding International Conference Computer Aided Design, pp. 129–136 (2003)
2. Bohr, M.T.: Nanotechnology goals and challenges for electronic applications. IEEE Trans. Nanotechnol. 1(1), 56–62 (2002)
3. Roy, K., Prasad, S.C.: Low Power CMOS VLSI Circuit Design. Wiley India Publication (2011)
4. Akashe, S., Shrives, J., Tiwari, N., Sharma, R.: A novel high speed and power efficient half adder design using MTCMOS technique in 45 nanometer regime. In: Proceeding IEEE International Conference on Advanced Communication Control and Computing Technologies (ICACCCT), Ramanathapuram (2012)
5. Ko, H.-J., Hsiao, S.-F.: Design and application of faithfully rounded and truncated multipliers with combined deletion, reduction, truncation and rounding. IEEE Trans. Circuits Syst. II Exp. Briefs 58(5), 304–308 (2011)
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