Principle and Analysis of EMS: EFT Mechanism and Protection
Author:
Publisher
Springer Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-16-6452-6_7
Reference10 articles.
1. Zhai X, Wang J, Geng Y, et al. Transfer function and network synthesis of electrical fast transient/burst generator based on latent-roots method. IEEE Trans Electromagn Compat. 2010;52(4):790–6.
2. Cerri G, De Leo R, Primiani VM. Electrical fast-transient test: Conducted and radiated disturbance determination by a complete source modeling. IEEE Trans Electromagn Compat. 2001;43(1):37–44.
3. Wu J, Li B, Zhu W, et al. Investigations on the EFT immunity of microcontrollers with different architectures. Microelectron Reliab. 2017;76–77:708–13.
4. Zhai X, Geng Y, Wang J, et al. New method to model the equivalent circuit of the pulse generator in electrical fast transient/burst test. ICE Trans Electron. 2009;92(8):1052–7.
5. Carobbi CFM. Measurement error of the standard unidirectional impulse waveforms due to the limited bandwidth of the measuring system. IEEE Trans Electromagn Compat. 2013;55(4):692–8.
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