Publisher
Springer Nature Singapore
Reference43 articles.
1. Frank, Device scaling limits of Si MOSFETs and their application dependencies. Proc. IEEE 89, 259–288 (2001)
2. A.R. West, Solid State Chemistry, 2nd edn. (Willey, Singapore, 2003)
3. M.C. Rao, A brief survey on basic properties of thin films for device application. Int. J. Mod. 22, 576–582 (2013)
4. A.N. Cleland, Very low noise photodetector based on the single electron transistor. Appl. Phys. Lett. 61, 2820 (1992)
5. S.S. Kalarickal, Ferromagnetic resonance linewidth in metallic thin films: comparison of measurement methods. J. Appl. Phys. 99, 093909 (2006)