Development and Application of Dynamic Test Device for 6.5 kV/400 A SiC MOSFET Module-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Development and Application of Dynamic Test Device for 6.5 kV/400 A SiC MOSFET Module

Published:2023 Issue: Volume: Page:606-616
ISSN:1876-1100
Container-title:Lecture Notes in Electrical Engineering
language:
Short-container-title:

Author:

Li Xinyi,Du Yujie,Tang Xinling,Li Shiyan,Zhang Junming,Yang Fei

Publisher

Springer Nature Singapore

Link

https://link.springer.com/content/pdf/10.1007/978-981-99-0357-3_61

Reference10 articles.

1. Sheng, K., Guo, Q., Zhang, J., Qian, Z.: Application prospect of silicon carbide power electronic devices in power system. Proc. CSEE 32(30), 1–7+3 (2012)

2. IEC 60747-8:2010 Semiconductor Devices-Discrete Devices-Part 8: Field-Effect Transistors. International Electrotechnical Commission (2010)

3. Tektronix 370A and 371A Curve Tracer Data Sheet. Tektronix Inc. (1996)

4. Agilent B1505A Power Device Analyzer Curve Tracer. Agilent Technologies (China) Co., Ltd. (2012)

5. Xi’an Mattel Electric Technology Co., Ltd.: IGBT comprehensive parameter test system [EB/OL]. http://www.xameitai.com

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Dynamic Performance of 6.5kV/400A SiC MOSFET Module and its Gate Driver;2023 IEEE 7th Conference on Energy Internet and Energy System Integration (EI2);2023-12-15

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP