Experimentation for a Better Magnetic Force Microscopy Probe
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Publisher
Springer Nature Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-19-4606-6_74
Reference15 articles.
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2. Rugar, D., Mamin, H.J., Guethner, P., Lambert, S.E., Stern, J.E., McFadyen, I., Yogi, T.: Magnetic force microscopy: general principles and application to longitudinal recording media. J. Appl. Phys. 68(3), 1169–1183 (1990). https://doi.org/10.1063/1.346713
3. Sueoka, K., Inagami, K., Imamura, T., Tatebe, K., Mukasa, K.: Magnetic force microscope (MFM) imaging with electrodeposited tips. 1419–1422 (2002). https://doi.org/10.1109/imtc.1994.352162
4. Huang, H.S., Lin, M.W., Sun, Y.C., Lin, L.J.: Improving the spatial resolution of a magnetic force microscope tip via focused ion beam modification and magnetic film coating. Scr. Mater. 56(5), 365–368 (2007)
5. Hsu, Y.N., Jeong, S., Laughlin, D.E., Lambeth, D.N.: Effects of Ag underlayers on the microstructure and magnetic properties of epitaxial FePt thin films. J. Appl. Phys. 89(11 II), 7068–7070 (2001). https://doi.org/10.1063/1.1360683
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