Thermal Fractionation Technique to Evaluate the Effect of Microstructure Defects on Dielectric Properties of Polypropylene
Author:
Publisher
Springer Nature Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-97-2245-7_50
Reference5 articles.
1. O.G. Gnonhoue, A. Velazquez-Salazar, É. David et al., Review of technologies and materials used in high-voltage film capacitors. Polym. 13(5), 766 (2021)
2. M.H. El-Husseini, P. Venet, G. Rojat et al., Thermal simulation for geometric optimization of metallized polypropylene film capacitors. IEEE Trans. Ind. Appl. 38(3), 713–718 (2002)
3. D. Tan, L. Zhang, Q. Chen et al., High-temperature capacitor polymer films. J. Electron. Mater. 43, 4569–4575 (2014)
4. R.A. Pérez-Camargo, D. Cavallo, A.J. Müller, Recent applications of the successive self-nucleation and annealing thermal fractionation technique. Front. Soft Matt. 2, 1003500 (2022)
5. S. Hu, H. Yuan, Q. Zhang et al., Deep trap origins, characteristics, and related mechanisms in chemically grafted polypropylene with enhanced direct current volume resistivity. J. Phys. Chem. C 126(38), 16280–16288 (2022)
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