A Utility of Ridge Contour Points in Minutiae-Based Fingerprint Matching-Reference-Cited by-同舟云学术

A Utility of Ridge Contour Points in Minutiae-Based Fingerprint Matching

Published:2020-12-21 Issue: Volume: Page:273-286
ISSN:2367-4512
Container-title:Proceedings of International Conference on Computational Intelligence and Data Engineering
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Author:

Agarwal Diwakar,Garima ,Bansal Atul

Publisher

Springer Singapore

Link

http://link.springer.com/content/pdf/10.1007/978-981-15-8767-2_24

Reference15 articles.

1. Jain AK, Chen Y, Demirkus M (2006) Pores and ridges: high-resolution fingerprint matching using level 3 features. IEEE Trans Pattern Anal Mach Intell 29(1):15–27

2. CDEFFS: The ANIS/NIST Committee to Define an Extended Fingerprint Feature Set. https://fingerprint.nist.gov/standard/cdeffs/index.html. Accessed 18 Mar 2020

3. Besl PJ, McKay ND (1992) A method for registration of 3D shapes. IEEE Trans Pattern Anal Mach Intell 14(2):239–256

4. Cappelli R, Ferrara M, Franco A, Maltoni D (2007) Fingerprint verification competition 2006. Biom Technol Today 15(7–8):7–9

5. Jiang X, Yau WY (2000) Fingerprint minutiae matching based on the local and global structures. In: Proceedings 15th international conference on pattern recognition (ICPR-2000), vol 2. IEEE, pp 1038–1041

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