On the performance of wavelength meters: Part 2—frequency-comb based characterization for more accurate absolute wavelength determinations

Abstract

AbstractWavelength meters are widely used for frequency determinations and stabilization purposes since they cover a large wavelength range, provide a high read-out rate and have specified accuracies of up to $$10^{-8}$$10-8. More accurate optical frequency measurements can be achieved with frequency combs but only at the price of considerably higher costs and complexity. In the context of precise and accurate frequency determinations for high-resolution laser spectroscopy, the performance of five different wavelength meters was quantified with respect to a frequency comb. The relative precision as well as the absolute accuracy has been investigated in detail, allowing us to give a sophisticated uncertainty margin for the individual instruments. We encountered a prominent substructure on the deviation between both device types with an amplitude of a few MHz that is repeating on the GHz scale. This finally limits the precision of laser scans which are monitored and controlled with wavelength meters. While quantifying its uncertainty margins, we found a high temporal stability in the characteristics of the wavelength meters which enables the preparation of wavelength-dependent adjustment curves for wide- and short-ranged scans. With this method, the absolute accuracy of wavelength meters can be raised up to the MHz level independently from the wavelength of the reference laser used for calibrating the device. Since this technique can be universally applied, it can lead to benefits in all fields of wavelength meter applications.