Simultaneous measurement of liquid water film thickness and vapor temperature using near-infrared tunable diode laser spectroscopy-Reference-Cited by-同舟云学术

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Simultaneous measurement of liquid water film thickness and vapor temperature using near-infrared tunable diode laser spectroscopy

Published:2010-03-19 Issue:3 Volume:99 Page:385-390
ISSN:0946-2171
Container-title:Applied Physics B
language:en
Short-container-title:Appl. Phys. B

Author:

Yang H.,Greszik D.,Dreier T.,Schulz C.

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://link.springer.com/content/pdf/10.1007/s00340-010-3980-3.pdf

Reference22 articles.

1. W. Hentschel, A. Grote, O. Langer, SAE Technical Paper, 972832 (1997)

2. M.C. Drake, T.D. Fansler, A.S. Solomon, J.G.A. Szekely, SAE Technical Paper, 2003-01-0547 (2003)

3. P.G. Felton, D.C. Kyritsis, S.K. Fulcher, SAE Technical Paper, 952464 (1995)

4. A.I. Petruchik, S.P. Fisenko, J. Eng. Phys. Thermophys. 72, 43 (1999)

5. S. Wittig, J. Himmelsbach, B. Noll, H.J. Feld, W. Samenfink, J. Eng. Gas Turbines Power 114, 395 (1992)

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