Laser intensity effects in carrier-envelope phase-tagged time of flight-photoemission electron microscopy-Reference-Cited by-同舟云学术

Laser intensity effects in carrier-envelope phase-tagged time of flight-photoemission electron microscopy

Published:2016-04 Issue:4 Volume:122 Page:
ISSN:0946-2171
Container-title:Applied Physics B
language:en
Short-container-title:Appl. Phys. B

Author:

Chew S. H.,Gliserin A.,Schmidt J.,Bian H.,Nobis S.,Schertz F.,Kübel M.,Yang Y.-Y.,Loitsch B.,Stettner T.,Finley J. J.,Späth C.,Ouacha H.,Azzeer A. M.,Kleineberg U.

Funder

DFG

Deanship of Scientific Research at King Saud University

TUM-IAS Focus group “Nanophotonics”

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://link.springer.com/content/pdf/10.1007/s00340-016-6374-3.pdf

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