Author:
Yannakakis Mihalis,Lee David
Publisher
Springer Berlin Heidelberg
Reference36 articles.
1. Agrawal, V.D., Seth, S.C.: Test Generation for VLSI Chips. Computer Society Press (1988)
2. Aho, A.V., Dahbura, A.T., Lee, D., Uyar, M.U.: An optimization technique for protocol conformance test generation based on UIO sequences and rural Chinese postman tours. IEEE Trans. on Communication 39(11), 1604–1615 (1991)
3. Alur, R., Courcoubetis, C., Yannakakis, M.: Distinguishing tests for nondeterministic and probabilistic machines. In: Proc. 27th Ann. ACM Symp. on Theory of Computing, pp. 363–372 (1995)
4. Angluin, D.: Learning regular sets from queries and counter examples. Inform. and Comp. 75, 87–106 (1987)
5. International standard ISO 8802-2, ANSI/IEEE std 802.2 (1989)
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Spinal Test Suites for Software Product Lines;Electronic Proceedings in Theoretical Computer Science;2014-03-27
2. Synchrony and asynchrony in conformance testing;Software & Systems Modeling;2013-01-25
3. The Complexity of Coverage;Programming Languages and Systems;2008