A comparison of image processing techniques for optical interference fringe analysis-Reference-Cited by-同舟云学术

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A comparison of image processing techniques for optical interference fringe analysis

Published:2015-08-26 Issue:4 Volume:5 Page:304-311
ISSN:1674-9251
Container-title:Photonic Sensors
language:en
Short-container-title:Photonic Sens

Author:

Farooq Muhammad,Aslam Aasma,Hussain Babar,Hussain Ghazanfar,Ikram Masroor

Publisher

Springer Science and Business Media LLC

Subject

Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s13320-015-0254-z.pdf

Reference26 articles.

1. E. Hecht, Optics, 4th Edition, Boston: Addison-Wesley, 2002.

2. C. G. Chen, P. T. Konkola, R. K. Heilmann, C. Joo, and M. L. Schattenburg, “Nanometer accurate grating fabrication with scanning beam interference lithography,” in Proc. SPIE, vol. 4936, pp. 126–134, 2002.

3. M. Buendia, R. Cibrian, R. Salvador, C. Roldan, and J. M. Inesta, “Automatic analysis of speckle photography fringes,” Applied Optics, 1997, 36(11): 2395–2400.

4. L. He, “Vibration-compensated interferometry system using phase-modulating interference fringe subdivision technology,” Applied Optics, 2006, 45(31): 7987–7992.

5. B. Hussain, M. Ahmed, G. Hussain, M. Saleem, and M. Nawaz, “Analog processing based vibration measurement technique using Michelson interferometer,” Photonic Sensors, 2013, 3(2): 137–143.

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