The effect of randomness in the distribution of impurity atoms on FET thresholds
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Materials Science,General Chemistry,General Engineering
Link
http://link.springer.com/content/pdf/10.1007/BF00896619.pdf
Reference13 articles.
1. E.H.Nicollian, A.Goetzberger: Bell System Tech. J.46, 1055 (1967)
2. J.R.Brews: J. Appl. Phys.43, 2306 (1972);46, 2181 (1975)
3. R.Landauer: J. Appl. Phys.23, 779 (1952) and unpublished work
4. C.Herring: J. Appl. Phys.31, 1939 (1960)
5. P.Dean, N.F.Bird: Proc. Cambridge Phil. Soc.63, 477 (1967)
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