Investigation of the formation and properties of protective oxide layers on high purity chromium with SIMS imaging techniques-Reference-Cited by-同舟云学术

Investigation of the formation and properties of protective oxide layers on high purity chromium with SIMS imaging techniques

Published:1997-03 Issue:1-4 Volume:125 Page:69-72
ISSN:0026-3672
Container-title:Mikrochimica Acta
language:en
Short-container-title:Mikrochim Acta

Author:

Brunner Christian,Hutter Herbert,Wilhartitz Peter,Grasserbauer Manfred

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF01246164.pdf

Reference8 articles.

1. H. P. Martinz, W. K�ck, T. Sakaki,J. Physique [Suppl. IV(CP)] 1993,III(3), 205.

2. H. Hutter, Ch. Brunner, P. Wilhartitz, M. Grasserbauer,Mikrochima. Acta 1996,122, 195.

3. F. G. R�denauer, W. Steiger inSecondary Ion Mass Spectrometry SIMS VI (A. Benninghoven, A. M. Huber, H. W. Werner, eds.), Wiley, Chichester, 1988, p. 361.

4. S. R. Bryan, W. S. Woodward, D. P. Griffis, R. W. Linton,J. Microsc. 1985,138, 15.

5. F. Michiels, W. Vanhoolst, P. Van Espen, F. Adams,American Society for Mass Spec. 1, 1990, p. 37.

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