Reflectance and photoreflectance for in-situ monitoring of the molecular beam epitaxial growth of CdTe and Hg-based materials-Reference-Cited by-同舟云学术

Reflectance and photoreflectance for in-situ monitoring of the molecular beam epitaxial growth of CdTe and Hg-based materials

Published:1995-05 Issue:5 Volume:24 Page:685-690
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:JEM

Author:

Yu Zhonghai,Mattson M. A.,Myers T. H.,Harris K. A.,Yanka R. W.,Mohnkern L. M.,Lew Yan Voon L. C.,Ram-Mohan L. R.,Benz R. G.,Wagner B. K.,SummersBenz C. J.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/BF02657979.pdf

Reference23 articles.

1. J.M. Arias, J.G. Pasko, M. Zandian, S.H. Shin, G.M. Williams, L.O. Bubulac, R.E. DeWames and W.E. Tennant,J.Electron. Mater. (1993).

2. R.W. Yanka, K.A. Harris, L.M. Mohnkern, A.R. Reisinger and T.H. Myers,J. Electron. Mater. (1993).

3. H. Shen,SPIE Proc: Modulation Spectroscopy, 1286, 125 (1990).

4. H. Shen and M. Dutta,Appl. Phys. Lett. 57, 5879 (1990).

5. Zhonghai Yu, S.G. Hofer, N.C. Giles, T.H. Myers, D. Rajaveland C.J Summers, submitted toPhys. Rev. B.

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Photoreflectance spectroscopy study of a strained-layer CdTe/ZnTe superlattice;Journal of Applied Physics;2011-11

2. HgTe segregation process in HgCdTe studied by E1 reflectance peak positions;physica status solidi (c);2006-03

3. Influence of long-term defect diffusion on HgCdTe electronic structure;The European Physical Journal Applied Physics;2004-07

4. Effects of substrate preheating for the growth of by MOCVD;Journal of Crystal Growth;1997-09