Multiple parametric fault diagnosis using computational intelligence techniques in linear filter circuit
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Computer Science
Link
http://link.springer.com/content/pdf/10.1007/s12652-020-01908-0.pdf
Reference36 articles.
1. Aminian M, Aminian F (2000) Neural-network based analog-circuit fault diagnosis using wavelet transform as pre-processor. IEEE Trans Circuits SystII Analog Digit Signal Process 47(2):151–156. https://doi.org/10.1109/82.823545
2. Aminian M, Aminian F (2007) A modular fault-diagnostic system for analog electronic circuits using neural networks with wavelet transform as a preprocessor. IEEE Trans Instrum Meas 56(5):1546–1554. https://doi.org/10.1109/TIM.2007.904549
3. Aminian F, Aminian M, Collins HW (2002) Analog fault diagnosis of actual circuits using neural networks. IEEE Trans Instrum Meas 51(3):544–550. https://doi.org/10.1109/TIM.2002.1017726
4. Cao J, Lin Z, Huang GB (2012) Self-adaptive evolutionary extreme learning machine. Neural Process Lett 36(3):285–305. https://doi.org/10.1007/s11063-012-9236-y
5. Devarayanadurg G, Soma M (1995) Dynamic test signal design for analog IC. In Computer-Aided Design, ICCAD-95. Digest of Technical Papers, IEEE/ACM International Conference, 627–630. https://doi.org/10.1109/ICCAD.1995.480194
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