1. D.A. Koss and S.M. Copley:Metall. Trans., 1971, vol. 2, pp. 1557–60.
2. M.R. James and J.B. Cohen: inTreatise on Materials Science and Technology, H. Herman, ed., Academic Press, New York, NY, 1980, vol. 19A, pp. 1–62.
3. I.C. Noy an and J.B. Cohen:Residual Stress—Measurement by Diffraction and Interpretation, Springer-Verlag, New York, NY, 1987, pp. 66–72.
4. M.R. James:Proc. 2nd Int. Conf. on Residual Stresses (ICRS-2), Nancy, France, Nov. 1988, G. Beck, S. Denis, and A. Simon, eds., Elsevier, Amsterdam, Holland, 1989, pp. 429–35.
5. H. Dolle:J. Appl. Crystallogr., 1979, vol. 12, p. 489.