Surface and in-depth characterization of TiC/C and Ti(C,N) layers by means of AES and Factor analysis-Reference-Cited by-同舟云学术

Surface and in-depth characterization of TiC/C and Ti(C,N) layers by means of AES and Factor analysis

Published:1995 Issue:3-4 Volume:353 Page:468-472
ISSN:0937-0633
Container-title:Fresenius' Journal of Analytical Chemistry
language:en
Short-container-title:Fresenius J Anal Chem

Author:

John A.

Publisher

Springer Science and Business Media LLC

Subject

Biochemistry,Analytical Chemistry,Biochemistry

Link

http://link.springer.com/content/pdf/10.1007/BF00322090.pdf

Reference16 articles.

1. Toth LE (1971) Transitional metal carbides and nitrides. Academic Press, New York

2. Davis LE, MacDonald NC, Plamberg PW, Riach GE, Weber RE (1976) Handbook of Auger electron spectroscopy. Physical Electronics Industries, Eden Prairie, MN, USA

3. Briggs D, Seah MP (1990) Practical surface analysis, vol 1, Auger and X-ray photoelectron spectroscopy. Wiley, Chichester New York Brisbane Toronto Singapore

4. Vignes JL, Langeron JP, Grigorov GI, Martev IN, Stoyanova MV (1991) Vacuum 42:151?153

5. Sundgren JE, Johansson BO, Karlsson SE (1983) Surface Sci 128:265?270

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