Objective comparison of concentration profiles in solids by means of mathematical statistics-Reference-Cited by-同舟云学术

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Objective comparison of concentration profiles in solids by means of mathematical statistics

Published:1989-07 Issue:4-6 Volume:98 Page:249-258
ISSN:0026-3672
Container-title:Mikrochimica Acta
language:en
Short-container-title:Mikrochim Acta

Author:

Ehrlich G�nter,Nestler Thomas,Voigtmann Rainer,Moldenhauer Willi

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF01244601.pdf

Reference6 articles.

1. K. Doerffel,Statistik in der analytischen Chemie, 4th Ed., Verlag für Grundstoffindustrie, Leipzig, 1987, p. 108.

2. C. R. Rao,Linear Statistical Interference and Its Applications, Wiley, New York, 1965, chapt. 8.

3. K. M. S. Humak,Statistische Methoden der Modellbildung II, Akademie-Verlag, Berlin, 1983, chapt. 1.1.

4. J. J. Morè,Numerical Analysis, Springer, New York Berlin Heidelberg, 1978, p. 105.

5. J. E. Dennis, D. M. Gay, R. E. Welsh,ACM Transactions on Mathematical Software 1981,7, 369.

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1. Comparison of depth profiles in SIMS by a fuzzy method;Mikrochimica Acta;1992-05

2. Thickness determination from the GDOS depth profiles using piece-wise linear model functions;Mikrochimica Acta;1992-01

3. Depth analysis of nickel thin films on silicon by glow discharge spectroscopy: The interface region;Surface and Interface Analysis;1990-12

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