Imaging insulating oxides by elevated-temperature STM-Reference-Cited by-同舟云学术

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Imaging insulating oxides by elevated-temperature STM

Published:1998-03-01 Issue:7 Volume:66 Page:S963-S967
ISSN:0947-8396
Container-title:Applied Physics A: Materials Science & Processing
language:
Short-container-title:Applied Physics A: Materials Science & Processing

Author:

Castell M.R.,Muggelberg C.,Dudarev S.L.,Sutton A.P.,Briggs G.A.D.,Goddard D.T.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s003390051275.pdf

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Thermodynamic stability of theUO2surfaces: Interplay between over-stoichiometry and polarity compensation;Physical Review B;2016-03-28

2. UO2Oxidative Corrosion by Nonclassical Diffusion;Physical Review Letters;2015-06-19

3. A procedure for bypassing metastable states in local basis set DFT+U calculations and its application to uranium dioxide surfaces;Computational Materials Science;2013-04

4. Bulk, surface and point defect properties in UO2from a tight-binding variable-charge model;Journal of Physics: Condensed Matter;2013-02-28

5. Hydroxylation-induced surface stability of AnO2 (An=U, Np, Pu) from first-principles;Surface Science;2013-02

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