Size distribution and optical properties of self-assembled Ge on Si-Reference-Cited by-同舟云学术

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Size distribution and optical properties of self-assembled Ge on Si

Published:2000-10-01 Issue:4 Volume:71 Page:423-432
ISSN:0947-8396
Container-title:Applied Physics A: Materials Science & Processing
language:
Short-container-title:Applied Physics A: Materials Science & Processing

Author:

Vescan L.,Goryll M.,Stoica T.,Gartner P.,Grimm K.,Chretien O.,Mateeva E.,Dieker C.,Holländer B.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s003390000555.pdf

Cited by 24 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Light-Emission from Ion-Implanted Group-IV Nanostructures;Topics in Applied Physics;2021

2. Site-controlled and advanced epitaxial Ge/Si quantum dots: fabrication, properties, and applications;Nanotechnology;2017-09-08

3. Photoluminescence enhancement through vertical stacking of defect-engineered Ge on Si quantum dots;Semiconductor Science and Technology;2017-01-16

4. Ultrafast electron dynamics in GeSi nanostructures;Physical Review B;2012-01-17

5. Microphotoluminescence and perfect ordering of SiGe islands on pit-patterned Si(001) substrates;Nanotechnology;2011-03-11

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