In-situ scanning tunnelling microscopy of hydrogenated amorphous silicon and microcrystalline silicon-Reference-Cited by-同舟云学术

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In-situ scanning tunnelling microscopy of hydrogenated amorphous silicon and microcrystalline silicon

Published:1998-03-01 Issue:7 Volume:66 Page:S1101-S1105
ISSN:0947-8396
Container-title:Applied Physics A: Materials Science & Processing
language:
Short-container-title:Applied Physics A: Materials Science & Processing

Author:

Flewitt A.J.,Froggatt M.W.D.,Milne W.I.,Stephenson A.W.,Welland M.E.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s003390051305.pdf

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Reduction in a-Si:H density utilizing a secondary plasma;Journal of Micro/Nanolithography, MEMS, and MOEMS;2019-12-28

2. Scanning tunneling microscopy of hydrogenated amorphous silicon: high-resolution topography and local apparent barrier heights;Applied Surface Science;1999-09

3. Scanning Tunnelling Microscopy Study of the Growth Mechanism for Hydrogenated Amorphous Silicon Produced by Plasma Enhanced Chemical Vapour Deposition;MRS Proceedings;1998

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