Development of a scanning atom probe and atom-by-atom mass analysis of diamonds-Reference-Cited by-同舟云学术

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Development of a scanning atom probe and atom-by-atom mass analysis of diamonds

Published:1998-03-01 Issue:7 Volume:66 Page:S11-S16
ISSN:0947-8396
Container-title:Applied Physics A: Materials Science & Processing
language:
Short-container-title:Applied Physics A: Materials Science & Processing

Author:

Nishikawa O.,Sekine T.,Ohtani Y.,Maeda K.,Numada Y.,Watanabe M.,Iwatsuki M.,Aoki S.,Itoh J.,Yamanaka K.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s003390051090.pdf

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Modular Atom Probe Concept: Design, Operational Aspects, and Performance of an Integrated APT-FIB/SEM Solution;Microscopy and Microanalysis;2022-08-01

2. Atom Probe Analysis of One Dimensional Organic Chain: Polyethylene Glycol;e-Journal of Surface Science and Nanotechnology;2020-05-28

3. Atom Probe Tomography: Development and Application to the Geosciences;Geostandards and Geoanalytical Research;2020-02-26

4. Laser-Assisted Field Evaporation and Three-Dimensional Atom-by-Atom Mapping of Diamond Isotopic Homojunctions;Nano Letters;2016-01-13

5. Mass Spectrometry in Semiconductor Research;Mass Spectrometry Handbook;2012-05-21

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