Oberfl�chenanalyse durch IR-ATR-Spektroskopie-Reference-Cited by-同舟云学术

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Oberfl�chenanalyse durch IR-ATR-Spektroskopie

Published:1978-09 Issue:5-6 Volume:69 Page:415-424
ISSN:0026-3672
Container-title:Mikrochimica Acta
language:de
Short-container-title:Mikrochim Acta

Author:

Kellner R.,Gid�ly G.

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF01201594.pdf

Reference5 articles.

1. H. Weitkamp und R. Barth, Einf�hrung in die quantitative Infrarotspektroskopie, Leipzig: G. Thieme. 1976.

2. N. J. Harrick, Internal Reflection Spectroscopy, New York: Interscience. 1967.

3. R. Kellner, Analyt. Chim. Acta70, 275 (1974).

4. F. Unger, �sterr. Patentanmeldung 1495/75.

5. R. Kellner und F. Unger, Z. analyt. Chem.283, 349 (1977).

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Attenuated total reflection infrared spectroscopy: its applications to coating materials;Progress in Organic Coatings;1983-10

2. Fourier transform infrared (FTIR) ? attenuated total reflectance (ATR) ? spectra of metal-dithiocarbamate single crystal surfaces with polarized radiation;Mikrochimica Acta;1983-05

3. Simultaneous qualitative and quantitative FT-IR-ATR-spectroscopic analysis of submicrometre organic films and of the surface layer of bulk polymer samples;Mikrochimica Acta;1981-01

4. Microchemical characterization of paintings ? A case study;Mikrochimica Acta;1981-01

5. Quantitative IR-ATR-Spektrometrie ohne Eichkurven;Fresenius' Zeitschrift für analytische Chemie;1979-01

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