X-ray diffraction study of epitaxial zinc and cadmium films prepared by hot-wall technique-Reference-Cited by-同舟云学术

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X-ray diffraction study of epitaxial zinc and cadmium films prepared by hot-wall technique

Published:1986-10 Issue:4 Volume:8 Page:449-452
ISSN:0250-4707
Container-title:Bulletin of Materials Science
language:en
Short-container-title:Bull. Mater. Sci.

Author:

Kulkarni A V,Pratap R

Publisher

Springer Science and Business Media LLC

Subject

Mechanics of Materials,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF02744109.pdf

Reference4 articles.

1. Bandopadhyay S K and Pal A K 1979J. Mater. Sci. 14 2989

2. Chopra K L 1969 Thin-film phenomena (New York: McGraw-Hill) 226

3. Kulkarni A V, Bose S and Pratap R 1984Thin Solid Films 120 L73-L77

4. Nandi R K, Suchitra Sen and Sen-Gupta P 1978Thin Solid Films 51 141

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electrophoretically fabricated nickel/nickel oxides as cost effective nanocatalysts for the oxygen reduction reaction in air-cathode microbial fuel cell;International Journal of Hydrogen Energy;2020-02

2. Simulation for deposition of cadmium telluride thin films in hot wall epitaxial system using Monte Carlo technique;Journal of Physics D: Applied Physics;2006-03-30

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