Author:
Shafiq M. Zubair,Meiners Chad,Qin Zheng,Shen Ke,Liu Alex X.
Publisher
Springer Science and Business Media LLC
Subject
Strategy and Management,Computer Networks and Communications,Hardware and Architecture,Information Systems
Reference23 articles.
1. Meiners, C.R., Liu, A.X., Torng, E.: Topological transformation approaches to optimizing tcam-based packet processing systems. In: Proceedings of the ACM SIGMETRICS, pp. 73–84 (2009)
2. Baumann, R.: Soft errors in advanced computer systems. IEEE Des. Test Comput. 22(3), 258–266 (2005). doi: 10.1109/MDT.2005.69
3. Schrimpf, R., Fleetwood, D. (eds): Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices. World Scientific, Singapore (2004)
4. Bremler-Barr, A., Hay, D., Hendler, D., Roth, R.: PEDS: a parallel error detection scheme for TCAM devices. In: Proceedings of the 29th Conference on Computer Communications (INFOCOM), pp. 1296–1304 (2009). doi: 10.1109/INFCOM.2009.5062044
5. Mastipuram, R., Wee, E.C.: Cypress Semiconductor: Soft Errors’ Impact on System Reliability. Cypress Semiconducto—EDN, San Jose (2004)
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