In-situ dimensional measurement system for overlapped rubber layers

Author:

Wang Yung-Cheng,Shyu Lih-Horng,Chang Chung-Ping,Li Ming-Li,Liu Zao-Sheng

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. George, A.R., Dahlquist, J.A.: Non-contact sensor and method using inductance and laser distance measurements for measuring the thickness of a layer of material overlaying a substrate. US Patent US5355083 A, 1994

2. Grann, E.B., Holcomb, D.E.: High-speed non-contact measuring apparatus for gauging the thickness of moving sheet material. US Patent US6038028 A, 2000

3. Kumar, S., Tiwari, P.K., Chaudhury, S.B.: An optical triangulation method for non-contact profile measurement. In: Industrial Technology, 2006. ICIT 2006. IEEE International Conference, pp. 2878–2883 (2006)

4. Petrović, P.B.: Rubberized cord thickness measurement based on laser triangulation, part I: technology. FME Trans. 35(2), 77–84 (2007)

5. Spinola C.: Calibration of thickness measurement instruments based on twin laser sensors. Isoline bilinear look up tables. In: IMTC 2001, Proceedings of the 18th IEEE, vol. 2, pp. 1079–1083 (2001)

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