Influences of electrode material and design on the reliability of IRFPAs detector under thermal shock-Reference-Cited by-同舟云学术

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Influences of electrode material and design on the reliability of IRFPAs detector under thermal shock

Published:2017-01-23 Issue:2 Volume:49 Page:
ISSN:0306-8919
Container-title:Optical and Quantum Electronics
language:en
Short-container-title:Opt Quant Electron

Author:

Zhang Liwen,Li Na,Song Lu,Meng Qingduan,Xu Meiyu,Lei Zhen

Funder

National Natural Science Foundation of China (CN)

National Natural Science Foundation of China

Youth Foundation of Henan Science and Technology University

Foundation of Educational Commission of Henan Province(CN)

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s11082-017-0908-8.pdf

Reference18 articles.

1. Bai, J., Hu, W.D., Guo, N., Lei, W., Lv, Y.Q., Zhang, X.L., Si, J.J., Chen, X.S., Lu, W.: Performance optimization of InSb infrared focal-plane arrays with diffractive microlenses. J. Electron. Mater. 43(8), 2795–2801 (2014)

2. Benson, R.G., Forrest, W.J., Pipher, J.L., Glaccum, W.J., Solomon, S.L.: Spatial distributions of hole traps and image latency in InSb focal plane arrays. In: Proceedings of SPIE, vol. 4131, pp. 171–184 (2000)

3. Chang, R.W., McCluskey, F.P.: Constitutive relations of indium in extreme-temperature electronic packaging based on Anand model. J. Electron. Mater. 38(9), 1855–1859 (2009)

4. Cheng, X., Liu, C., Silberschmidt, V.V.: Numerical analysis of thermo-mechanical behavior of indium micro-joint at cryogenic temperatures. Comput. Mater. Sci. 52(1), 274–281 (2012)

5. Davis, M., Greiner, M.: Indium antimonide large-format detector arrays. Opt. Eng. 50(6), 061016 (2011)

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