Time-of-flight secondary ion mass spectrometry (TOF-SIMS) of polyisoprenes-Reference-Cited by-同舟云学术

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) of polyisoprenes

Published:1996-03 Issue:1-2 Volume:122 Page:1-15
ISSN:0026-3672
Container-title:Mikrochimica Acta
language:en
Short-container-title:Mikrochim Acta

Author:

Xu Keyang,Proctor Andrew,Hercules David M.

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF01252400.pdf

Reference21 articles.

1. M. L. Senyek, in:Encyclopedia of Polymer Science and Engineering vol. 8 (H. F. Mark, N. M. Bikales, C. G. Overberger, G. Menges, eds.) Wiley, New York, 1985, p. 487.

2. G. Sylvester, W. Wieder, in:ACS Symposium Series No. 193 (J. E. Mark, J. Lal eds.) Washington, D.C., ACS, 1982, p. 57, 1987.

3. M. Jernejcic, L. Premru,Rubber Chem. Technol. 1968,41, 411.

4. Z. Ronen,J. Chromatogr. 1982,236, 249.

5. D. R. Burfield, K. L. Lim,Macromolecules 1983,16, 1170.

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