A Novel Method of Analytical Transmission Electron Microscopy for Measuring Highly Accurately Segregation to Special Grain Boundaries or Planar Interfaces-Reference-Cited by-同舟云学术

A Novel Method of Analytical Transmission Electron Microscopy for Measuring Highly Accurately Segregation to Special Grain Boundaries or Planar Interfaces

Published:2006-04-18 Issue:1-2 Volume:155 Page:313-318
ISSN:0026-3672
Container-title:Microchimica Acta
language:en
Short-container-title:Microchim Acta

Author:

Walther Thomas,Rečnik Aleksander,Daneu Nina

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s00604-006-0562-5.pdf

Reference27 articles.

1. Temper embrittlement in a Ni-Cr steel containing phosphorus as impurity

2. Some Observations of Surface Segregation by Auger Electron Emission

3. On the measurement of equilibrium surface segregation using auger electron spectroscopy

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