Characterization of molecular beam epitaxially grown HgCdTe epilayers by mid-infrared interband magneto-absorption-Reference-Cited by-同舟云学术

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Characterization of molecular beam epitaxially grown HgCdTe epilayers by mid-infrared interband magneto-absorption

Published:1995-09 Issue:9 Volume:24 Page:1263-1268
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:JEM

Author:

Helgesen P.,Sizmann R.,Skauli T.,Colin T.,Steen H.,Løvold S.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/BF02653083.pdf

Reference15 articles.

1. M.H. Weiler,Semiconductors and Semimetals Vol. 16, ed. R.K. Willardson and A.C. Beer (New York: Academic Press, 1981).

2. D.G. Seiler, C.L. Littler and M.H. Weiler,Semiconductors and Semimetals Vol. 36, ed. R.K Willardsson and A.C. Beer (New York: Academic Press, 1992).

3. Y. Guldner, C. Rigaux, A. Mycielski and Y. Couder,Phys. Stat.Sol. 82, 149(1977).

4. Y. Guldner, C. Rigaux, A. Mycielski and Y. Couder,Phys. Stat. Sol. 81, 615 (1977).

5. B. Ellis and T.S. Moss,Proc. 3rd Int. Conf. Photocond. 211 (1969).

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