Quantitative phase analysis of Si3N4 by X-ray diffraction-Reference-Cited by-同舟云学术

Quantitative phase analysis of Si3N4 by X-ray diffraction

Published:1992 Issue:20 Volume:11 Page:1370-1372
ISSN:0261-8028
Container-title:Journal of Materials Science Letters
language:en
Short-container-title:J Mater Sci Lett

Author:

Pigeon R. G.,Varma A.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00729365.pdf

Reference4 articles.

1. C. P. GAZZARA and D. R. MESSIER,Bull. Amer. Ceram. Soc. 56 (1977) 777.

2. C. P. GAZZARA, in ?Advances in X-ray analysis? (Kendall/Hunt, Dubuque, Iowa, 1976) p. 735.

3. H. P. KLUG and L. E. ALEXANDER, in ?X-ray diffraction procedures for polycrystalline and amorphous materials?, 2nd Edn (Wiley, New York, 1974) p. 398.

4. B. D. CULLITY, in ?Elements of X-ray diffraction?, 2nd Edn (Addison-Wesley, Menlo Park, California, 1978) p. 225.

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