Author:
Göpel Wolfgang,Ziegler Christiane
Cited by
6 articles.
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1. A Novel Approach for Oxide Scale Growth Characterization: Combining Etching with Atomic Force Microscopy;Scanning Probe Microscopy in Nanoscience and Nanotechnology 2;2010-11-15
2. Silica on Silicon Carbide;Critical Reviews in Solid State and Materials Sciences;2008-02-13
3. Wichtige analytische Methoden;Teubner Studienbücher Chemie;2003
4. Grundlagen der Chemie fester Stoffe;Teubner Studienbücher Chemie;2003
5. Mechanische Testverfahren;Teubner Studienbücher Chemie;2003