Transmission electron microscopy of electrodeposits-Reference-Cited by-同舟云学术

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Transmission electron microscopy of electrodeposits

Published:1993-06 Issue:6 Volume:22 Page:639-644
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:JEM

Author:

Giannuzzi L. A.,Howell P. R.,Pickering H. W.,Bitler W. R.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/BF02666410.pdf

Reference24 articles.

1. W.H. Safranek,The Properties of Electrodeposited Metals and Alloys, 2nd Ed., page 382, American Electroplaters and Surface Finishers Society, Orlando, FL (1986).

2. R. Weil,Plating and Surface Finishing 74, 70 (1987).

3. S. Kaja, H.W. Pickering and W.R. Bitler,Plating and Surface Finishing 73, 58 (1986).

4. J. Hyres, M.S. Thesis, The Pennsylvania State University, University Park, PA, 16802 (1987).

5. N. Atanassov, St. Vitkov and St. Rashkov,Surf. Techn. 13, 215 (1981).

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A critical review of orientation microscopy in SEM and TEM;Crystal Research and Technology;2011-05-20

2. Advances in TEM orientation microscopy by combination of dark-field conical scanning and improved image matching;Ultramicroscopy;2009-10

3. On texture formation of nickel electrodeposits;Journal of Applied Electrochemistry;1997

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