Ellipsometric characterization of Cd1−x Mn x Te thin films in the presence of perturbative fields-Reference-Cited by-同舟云学术

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Ellipsometric characterization of Cd1−x Mn x Te thin films in the presence of perturbative fields

Published:1996-02 Issue:1 Volume:19 Page:139-145
ISSN:0250-4707
Container-title:Bulletin of Materials Science
language:en
Short-container-title:Bull. Mater. Sci.

Author:

Chandra Sharat,Malhotra L K,Rastogi A C

Publisher

Springer Science and Business Media LLC

Subject

Mechanics of Materials,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF02744796.pdf

Reference19 articles.

1. Aspnes D E and Moss T S 1980Handbook of semiconductors (Amsterdam: North-Holland) vol. 2

2. Bell R O 1977Rev. Phys. Appl. 12 391

3. Cardona M and Greenway D L 1968Phys. Rev. 131 98

4. Chandra S, Malhotra L K and Rastogi A C 1994Thin Solid Films 238 167

5. Fazzio A, Kaldas M J and Zunger A 1984Phys. Rev. B30 3430

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