FTIR, DTA and XRD study of sphene (CaTiSiO5) crystallization in a ceramic frit and a non-borate base glass-Reference-Cited by-同舟云学术

FTIR, DTA and XRD study of sphene (CaTiSiO5) crystallization in a ceramic frit and a non-borate base glass

Published:1994 Issue:11 Volume:29 Page:2921-2930
ISSN:0022-2461
Container-title:Journal of Materials Science
language:en
Short-container-title:J Mater Sci

Author:

Chen S. K.,Liu H. S.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF01117602.pdf

Reference27 articles.

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2. A. Putnis andD. L. Bish,Amer. Mineral. 68 (1983) 60.

3. D. M. Haaland, in ?Practical Fourier Transform Infrared Spectroscopy-Industrial and Laboratory Chemical Analysis? edited by J. R. Ferraro and K. Krishnan (Academic Press, California, 1990) pp. 395?469.

4. S. K. Chen, H. S. Liu andC. S. Wu,Appl. Spectrosc. 47 (1993) 965.

5. J. R. Taylor andA. C. Bull, ?Ceramic Glaze Technology? (Pergamon press, Oxford, 1986) pp. 50?62.

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