Correlation between electron spin resonance, electrical conductivity and optical absorption edge of co-evaporated thin films of the dielectric system SiO/V2O5-Reference-Cited by-同舟云学术

Correlation between electron spin resonance, electrical conductivity and optical absorption edge of co-evaporated thin films of the dielectric system SiO/V2O5

Published:1984-11 Issue:11 Volume:19 Page:3687-3691
ISSN:0022-2461
Container-title:Journal of Materials Science
language:en
Short-container-title:J Mater Sci

Author:

Al-Ramadhan F. A. S.,Arshak K. I.,Hogarth C. A.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF02396941.pdf

Reference17 articles.

1. C. A. Hogarth andL. A. Wright, Proceedings of the International Conference on Physics of Semiconductors, Moscow (1968) p. 1279.

2. H. Vardhan, G. C. Dubey andR. A. Singh,Thin Solid Films 8 (1971) 55.

3. G. C. Dubey, K. Sahu, T. R. Reddy andG. C. Trigunayat,ibid. 61 (1979) L17.

4. P. A. Timson andC. A. Hogarth,ibid. 10 (1972) 321.

5. M. Ilyas andC. A. Hogarth,J. Mater. Sci. Lett. 2 (1983) 535.

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