1. For a recent review, see R.B. James, T.E. Schlesinger, Jim Lund and Michael Schieber, Semiconductors and Semimetals Vol. 43, eds. T.E. Schlesinger and R.B. James (San Diego: Academic Press, 1995).
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4. F.P. Doty, J.P. Cozzatti and J.P. Schomer, SPIE Proc. Vol. 3115 (Bellingham, WA: SPIE, 1997), p. 51.
5. M.V. Alekseenko and A.I. Veinger, Sov. Phys. Semicond. 8, 143 (1974).