“Skip–Swap” method instead of “Skip–Fill” method in background calibration of pipelined ADCs-Reference-Cited by-同舟云学术

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“Skip–Swap” method instead of “Skip–Fill” method in background calibration of pipelined ADCs

Published:2015-05-08 Issue:1 Volume:84 Page:127-135
ISSN:0925-1030
Container-title:Analog Integrated Circuits and Signal Processing
language:en
Short-container-title:Analog Integr Circ Sig Process

Author:

Mohammadi Khanghah Meysam,Alipour Asl Amir,Najafi Aghdam Esmaeil,Dabbagh Sadeghipour Khosrov

Publisher

Springer Science and Business Media LLC

Subject

Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing

Link

http://link.springer.com/content/pdf/10.1007/s10470-015-0550-y.pdf

Reference21 articles.

1. Chiu, Y., Tsang, C. W., Nikolic, B., & Gray, P. R. (2004). Least mean square adaptive digital background calibration of pipelined analog-to-digital converters. IEEE Transactions on Circuits and Systems, 51(1), 38–46.

2. Moon, U. K., & Song, B. S. (1997). Background digital calibration techniques for pipelined ADCs. IEEE Transactions on Circuits and Systems, 44(2), 102–109.

3. Sahoo, B., & Razavi, B. (2009). A 12-bit 200-MHz CMOS ADC. IEEE Journal of Solid-State Circuits, 44(9), 2366–2380.

4. Verma, A., & Razavi, B. (2009). A 10-bit 500-MS/s 55-mW CMOS ADC. IEEE Journal of Solid-State Circuits, 44(11), 3039–3050.

5. Ingino, J. M., & Wooley, B. A. (1998). A continuously calibrated 12-b, 10-MS/s, 3.3-V A/D converter. IEEE Journal of Solid-State Circuits, 33, 1920–1931.

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1. A background split algorithm for high speed pipelined ADCs;Analog Integrated Circuits and Signal Processing;2016-05-04

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