Author:
Mulloni Viviana,Solazzi Francesco,Resta Giuseppe,Giacomozzi Flavio,Margesin Benno
Publisher
Springer Science and Business Media LLC
Subject
Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing
Reference17 articles.
1. Rebeiz, G. M. (2003). RF-MEMS: Theory design and technology. Hoboken: Wiley.
2. Daneshmand, M., & Mansour, R. (2007). Redundancy RF MEMS multiport switches and switch matrices. IEEE Journal of MEMS, 16, 296–303.
3. De Groot, W. A., Webster, J. R., Felnhofer, D., & Gusev, E. P. (2009). Review of device and reliability physics of dielectrics in electrostatically driven MEMS devices. IEEE Transaction on Device and Materials Reliability, 9, 190–202.
4. Van Spengen, W. M. (2012). Capacitive RF MEMS switch dielectric charging and reliability: A critical review with recommendations. Journal of Micromechanics and Microengineering, 22(074001), 23.
5. Yuan, X., et al. (2006). Acceleration of dielectric charging in RF MEMS capacitive switches. IEEE Transactions on Device and Materials Reliability, 6(4), 556–563.
Cited by
17 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献