Analog circuit soft-fault diagnosis based on sensitivity analysis with minimum fault number rule

Author:

Ji Lipeng,Hu Xiaohui

Publisher

Springer Science and Business Media LLC

Subject

Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing

Reference29 articles.

1. Bandler, J. W., & Salama, A. E. (1985). Fault diagnosis of analog circuits. Proceedings of the IEEE, 73(8), 1279–1325.

2. Wey, C. L., WU, C., & Saeks, R. (1988). Analog Fault diagnosis. In F. Lombardi & M. Sami (Eds.), Testing and diagnosis of VLSI and ULSI (Vol. 151). Dordrecht: Springer.

3. Devarayanadurg, G. & Soma, M. (1994). Analytical fault modeling and static test generation for analog ICs. In Proceedings of the 1994 IEEE/ACM international conference on computer-aided design (pp. 44–47).

4. Catelani, M., Ada, F., & Cesare, A. (2002). A fuzzy approach for soft fault detection in analog circuits. Measurement, 32, 73–83.

5. Huang, K., Stratigopoulos, H., & Mir, S. (2010). Fault diagnosis of analog circuits based on machine learning. In: Design, automation & test in Europe conference & exhibition (DATE) (pp. 1761–766). IEEE

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