Analysis and modeling of response of external noise in oscillators-Reference-Cited by-同舟云学术

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Analysis and modeling of response of external noise in oscillators

Published:2015-11-09 Issue:2 Volume:87 Page:313-325
ISSN:0925-1030
Container-title:Analog Integrated Circuits and Signal Processing
language:en
Short-container-title:Analog Integr Circ Sig Process

Author:

Yoshimura Tsutomu,Kihara Takao

Funder

STARC FS

Publisher

Springer Science and Business Media LLC

Subject

Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing

Link

http://link.springer.com/content/pdf/10.1007/s10470-015-0661-5.pdf

Reference19 articles.

1. Hajimiri, A., & Lee, T. H. (1998). A general theory of phase noise in electrical oscillators. IEEE Journal of Solid-State Circuits, 33(2), 179–194.

2. Eliezer, O. E., Staszewski, R. B., Bashir, I., Bhatara, S., & Balsara, P. T. (2009). A phase domain approach for mitigation of self-interference in wireless transceivers. IEEE Journal of Solid-State Circuits, 44(5), 1436–1453.

3. Bashir, I., Staszewski, R. B., Eliezer, O., Banerjee, B., & Balsara, P. T. (2011). A novel approach for mitigation of RF oscillator pulling in a polar transmitter. IEEE Journal of Solid-State Circuits, 46(2), 403–415.

4. Maffezzoni, P. (2008). Analysis of oscillator injection locking through phase-domain impulse-response. IEEE Transactions on Circuits and Systems I: Regular Papers, 55(5), 1297–1305.

5. Dunwell, D., & Carusone, A. C. (2013). Modeling oscillator injection locking using the phase domain response. IEEE Transactions on Circuits and Systems I: Regular Papers, 60(11), 2823–2833.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Self-Coupling and Mutual Pulling in Phase-Locked Loops;IEEE Transactions on Circuits and Systems I: Regular Papers;2022-08

2. Study of Injection Pulling of Oscillators in Phase-Locked Loops;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-02

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