Publisher
Springer Science and Business Media LLC
Subject
Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing
Reference28 articles.
1. Dodd, P. E., & Massengill, L. W. (2003). Basic mechanisms and modeling of single-event upset in digital microelectronics. IEEE Transactions on Nuclear Science, 50(3), 583–602.
2. Mitra, S., Karnik, T., Seifert, N., & Zhang, M. (2000). Logic soft errors in sub-65 nm technologies design and CAD challenges. In Proceedings on DAC, 2005 (pp. 2–3).
3. Normand, E. (1996). Single-event effects in avionics. IEEE Transactions on Nuclear Science, 43(2), 461–474.
4. Bradley, P. D., & Normand, E. (2004). Single event upset in implantable cardioverter defibrillators. IEEE Transactions on Nuclear Science, 45(6), 2929–2940.
5. Balasubramanian, A., Sternberg, A. L., Bhuva, B. L., & Massengill, L. W. (2006). Crosstalk effects caused by single event hits in deep sub-micron CMOS technologies. IEEE Transactions on Nuclear Science, 53(6), 3306–3311.
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Single Event Soft Errors;Noise Contamination in Nanoscale VLSI Circuits;2022