Gain and offset correction methods for analog-to-digital converters
Author:
Publisher
Springer Science and Business Media LLC
Subject
Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing
Link
http://link.springer.com/content/pdf/10.1007/s10470-011-9626-5.pdf
Reference16 articles.
1. Shyu, J.-B., Temes, G. C., & Krummenacher, F. (1984). Random errors effects in matched MOS capacitors and current sources. IEEE Journal of Solid-State Circuits, SC-19, 948–955.
2. Pelgrom, M. J. M., Duinmaijer, A. C. J., & Welbers, A. P. G. (1989). Matching properties of MOS transistors. IEEE Journal of Solid-State Circuits, 24, 1433–1440.
3. Razavi, B. (1994). Principles of data conversion. New York: Wiley.
4. Machado, G. A. S., Battersby, N. C., & Chris, T. (1997). On the development of analogue sampled-data signal processing. Analog Integrated Circuits and Signal Processing, 12(3), 179–199.
5. Li, M. F., Yep, S. Y., & Lim, Y. C. (1997). A novel integrated CMOS switch circuit for high precision sample-and-hold technique. Analog Integrated Circuits and Signal Processing, 12(3), 211–215.
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